Ellipsometry and Reflectometry

Spectroscopic ellipsometry (SE) is a powerful technique to precisely measure thin film thickness, determine optical constants, investigate surface and interface phenomenon and many other physical, chemical and optical properties of materials. PicoTech offers high quality spectroscopic ellipsometer systems with various options for different applications. Besides ellipsometer system itself, the advanced analysis software is essential to extract the desired information as above-mentioned, such as thickness, roughness, alloy concentration and dielectric constants.