Scanning Electron Microscopes (SEM) and Focused Ion Beam FIB-SEM

With over 3000 SEM’s all over the world, TESCAN is a leading global designer and manufacturer of scanning electron microscopes (SEM) and system solutions for different applications.

 

With a wide product range, TESCAN builds SEMs for any application need, from Tungsten Filament microscopes to high-resolution field emission SEMs and Focused Ion Beam SEM.

 

Visit our Tescan SEM’s page to find out more.

מיקרוסקופ אלקטרונים סורק SEM נכנס לשימוש שגרתי בתעשייה

מזעורן של מערכות, דרישות טיב חומר משופר, ותחרות הולכת וגוברת, מאלצת את היצרנים בכל המגזרים לשפר את יכולתם לראות בהגדלות שמעבר למיקרוסקופים האופטיים שברשותם.
החדשות הטובות הן שמחירם של המיקרוסקופים האלקטרונים הנדרשים לשם כך מפתיעים לטובה! המשך..

Complete solution for ELECTRON BEAM LITHOGRAPHY

TESCAN, the innovative Scanning Electron Microscope manufacturer also offers complete instrument solutions for Electron Beam Lithography. EBL has long been established as the premier technique for creating structures at the nanoscale as it allows creation of very small structures on the photo resist. This method was developed for manufacturing integrated circuits, spintronics and optoelectronics structures etc. by controling the beam generated inside the SEM column. TESCAN delivers extraordinary lithographic performance on its own high performance SEM, the combination of which ensures first class performance due to full integration with hardware. As typical for all TESCAN products, the TESCAN EBL PACKAGE provides the best price performance ratio when compared to competitors´ solutions. Read more

TOF-SIMS with access to all features of the FIB unique integration of othogonal TOF-SIMS by Tofwerk company and FIB-SEM by TESCAN

A novel, orthogonal extraction, medium mass resolution Time-of-Flight mass spectrometer (TOF-SIMS) provides a costeffective upgrade to dual focused ion and electron beam instruments (FIB-SEM) to allow SIMS chemical mapping. Depth profiling with a resolution of a few nanometers is a matter of course, and so full three-dimensional chemical mapping with nanometer resolution can be obtained. Read more…

World’s first fully-integrated Scanning Electron Microscope and Raman Imaging.

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through Raman Imaging and Scanning Electron Microscopy ultra-structural surface properties can be linked to molecular compound information. Read more..

XEIA

New UHR SEM/i-FIB workstation Whether your applications demand extremely powerful and ultra-fast micro-/nano- FIB machining, an outstanding image resolution at low beam energies,…. Read more…

GAIA

TESCAN GAIA3 brings together an ultra-high resolution electron column and high-performance ion column fitted onto a single chamber. Built on the proven (MAIA3) FE-SEM platform,…Read more…

FERA

The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to…Read more…

LYRA FIB-FESEM

The LYRA3 FEG is a favorable combination of SEM and FIB for demanding users. It is based on a high resolution Schottky FEG-SEM column and a high performance FIB column…Read more…

Q-PHASE

TESCAN proudly introduces the Q-PHASE, a multimodal holographic microscope (MHM). With this instrument TESCAN expands into the field of advanced light microscopy. The Q-PHASE is…Read more…

TIMA

The TESCAN Integrated Mineral Analyzer (TIMA) is a SEM-based automated mineralogy solution for the mining and minerals processing industries….Read more…

Accessories

The creation of favorable conditions for the complex analysis of specimens, together with the possibility of high-quality images of the specimen surface for morphological studies…Read more…

MAIA

MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.4….Read more…

MIRA

This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance…Read more…

VEGA

The VEGA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry.Read more…

Used and Upgraded SEMs

Buying a used SEM reconditioned by the SEM manufacturer is a safe way to get a reliable working SEM for a nice price. Are you interested in buying used SEM? Please contact us…Read more…

Special products

Using the modern designing and manufacturing systems we are flexible and open to develop and manufacture custom modifications or special custom systems….Read more…

Software

TESCAN produces a number of software solutions. The sophisticated control software is a standard part of every scanning electron microscope produced by TESCAN. There is also a…Read more…